Microscopic view of high-density semiconductor chiplet interconnects

The Operating System for Chiplet Manufacturing

Predict manufacturability before tapeout. Optimize yield before the fab. Unify wafer, substrate, isolation, and bonding in one physics-native stack.

ChipletOS is the first computational platform built to model the path from wafer behavior to package yield for advanced heterogeneous integration.

32+Production Solvers
10 ProductionML Models
1.6M+Impedance Database Rows
2,055Tests Passing
8 ValidatedGolden Kits
157API Endpoints
Built forCadenceSynopsysCorningIntelKLA
The Industry Shift

Advanced Packaging Has Outgrown Traditional EDA

The move to 2.5D and 3D integration has created a gap that legacy electronic design automation tools cannot bridge. Modeling structural stress, electromagnetic coupling, and thermal warpage across disparate silicon dies requires a unified approach.

report_problem

Fragmented Legacy Tools

Isolated simulators for thermal, mechanical, and signal integrity create dangerous data silos.

sync_alt

Unified ChipletOS Pipeline

A single physics-native kernel that handles interdependencies between bonding yield and signal loss.

Abstract visualization of interconnected semiconductor grid structure

“We are solving the ‘Physics of the Gap’ —the critical space between the silicon die and the final package.”

One Physics Layer Across the Full Fab-to-Package Stack

ChipletOS synchronizes data across every critical juncture of the manufacturing process.

0a
lens_blur

Wafer Warpage

Kirchhoff plate FEM for wafer-level stress prediction with sub-4ms latency.

0b
architecture

Package Warpage

Panel-level deformation modeling for assembly alignment across large-format substrates.

01
layers

BEM Impedance

3.57% MAE vs 5 IEEE papers. The industry's first glass TGV impedance PDK.

02
radar

Isolation Synthesis

Adjoint closed-loop optimizer. Adjoint gradient correlation r=1.0 verified against finite-difference.

03
handshake

Yield Prediction

GDS-to-yield pipeline for hybrid bonding. Physics + ML with KLA Archer overlay integration.

04
thermostat

Thermal Analysis

GPU thermal modeling for H100/B200 stable operation. LBM 720,000x speedup.

05
security

EM Verification

2,434 S2P touchstone files. Full signal integrity verification across the stack.

Built for the Hardest Problems in Heterogeneous Integration

Explore Full Capabilitiesarrow_forward

GDS In, Yield Out

The only end-to-end pipeline that connects CMP recess, contact mechanics, void nucleation, thermal stress, and Monte Carlo yield in one chain. Feed in a layout, get a yield prediction before you spend $500K on a mask set.

Topographic heatmap showing stress distribution on a silicon wafer
terminal

Unified API + CLI

Control the entire physics stack through a high-performance Python API or a secure, headless Linux CLI.

Glass TGV Impedance

The only multiconductor TGV impedance tool in existence. 3.57% MAE vs 5 IEEE papers. 1.6M+ BEM rows across 15+ glass types. Coaxial approximation is 55–225% wrong on glass.

Isolation Synthesis

The only tool that designs isolation structures, not just analyzes them. Adjoint topology optimization to DRC-clean GDSII export in one closed loop.

900+ Filed Patent Claims

Comprehensive IP coverage across BEM impedance, hybrid bonding yield, isolation synthesis, and digital twin pipelines. Full portfolio under NDA.

Executive Strategic Pillars

01

Predict Yield Before the Fab

The only GDS-to-yield pipeline for hybrid bonding. Seven coupled physics stages predict manufacturability before you commit silicon or glass. No more $500K mask-set surprises.

02

Design on Glass, Not Guesswork

No EDA vendor ships a glass-calibrated impedance model. Our BEM solver is 55–225% more accurate than the coaxial approximation on TGV geometries. 1.6M+ rows, 15+ glass types.

03

Turn Metrology Into Revenue

Bridge overlay registration data to bonding yield predictions. Make existing KLA Archer data predict yield, not just measure alignment error. The highest-scored claim in our portfolio.

Platform Snapshot

Solvers32+ Production
ML Models10 Production
Database1.6M+ Rows
ILC Controller982/1000 Wins
Patent Claims900+ Filed
verified2,055 automated tests passing across the full solver stack.
Technical line graph showing yield optimization curves
R²=0.99997BEM Surrogate Accuracy
<10msInference Latency

The Software Layer for the Chiplet Era

Join the consortium of leaders redefining semiconductor manufacturing.